发明名称 Circuit for a focused ion beam (FIB) sensor
摘要 A circuit is enabled to capacitively drive a memory cell (erasing, programming, and reading) via a capacitance. The capacitance is additionally present and isolates the antenna from the driver circuit of the memory cell. Charge accumulates on the antenna in the case of a FIB attack. The capacitance prevents the charge from flowing away, so that the voltage thus generated acts on the memory cell, which thus experiences a corresponding alteration of its charge state, which is detected. The capacitance can be implemented and realized in any conventional manner, such as any arbitrary capacitor structure of the circuit.
申请公布号 US6964378(B2) 申请公布日期 2005.11.15
申请号 US20030657602 申请日期 2003.09.08
申请人 INFINEON TECHNOLOGIES AG 发明人 TADDIKEN HANS
分类号 G06K19/073;G06F21/06;G06K19/07;G11C16/22;(IPC1-7):G06K19/06 主分类号 G06K19/073
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