| 摘要 |
PROBLEM TO BE SOLVED: To solve the problem that much time must be spent for measurement for an accurate analysis in a conventional X-ray diffractiometer to satisfy the demand of a method and an apparatus for quickly detecting contained constituents for recycling currently with an increase in the number of products to be recycled. SOLUTION: The X-ray diffractiometer for limiting secondary X rays entering a detection means 113 allows a sample 110 exposed to primary X rays emitted from an X-ray source 111 to generate secondary X rays, allows the secondary X rays to be detected by the detection means 113, performs computation based on the detection signal for obtaining spectra and detecting constituents contained in the sample 110, and has a shielding means 114 at a secondary X-ray path between the sample 110 and the detection means 113. COPYRIGHT: (C)2006,JPO&NCIPI
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