发明名称 WAFER POLISHING APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To provide a wafer polishing apparatus capable of eliminating inconvenience such as causing any scratch in a wafer and contaminating the wafer. <P>SOLUTION: The wafer polishing apparatus polishes a wafer by holding the wafer W on a holding head 14 and pressing the wafer to a polishing pad 20 via the holding head. The holding head comprises a protective sheet 52 for pressing the wafer to the polishing pad, a retainer 28 for holding the circumference of the protective sheet, and a carrier 24 for pressing the protective sheet of a part corresponding to a wafer region toward the wafer via fluid pressure. The protective sheet consists of a perforated sheet or a permeable sheet. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005317821(A) 申请公布日期 2005.11.10
申请号 JP20040135139 申请日期 2004.04.30
申请人 TOKYO SEIMITSU CO LTD 发明人 KINOSHITA OSAMU;SHIMIZU TAKASUKE
分类号 B24B37/04;B24B37/30;B24B37/32;H01L21/304 主分类号 B24B37/04
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