发明名称 PATTERN EXPOSURE METHOD AND PATTERN EXPOSURE APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To provide a pattern exposure method and a pattern exposure apparatus in which the throughput is improved with an inexpensive apparatus and without a low running cost. <P>SOLUTION: Output faces 5 of a plurality of laser beams 1a emitted from a plurality of semiconductor lasers respectively are arranged in two directions. One of the directions is the same direction as the scanning direction of a polygon mirror 27 while the other is a direction crossing the scanning direction of the polygon mirror 27. In this event, the array pitch of the output faces 15 arranged in the direction crossing the scanning direction of the polygon mirror 27 is made equal to resolution of an exposure pattern. In this event, the wavelength of each laser may be made not longer than 410 nm. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005316349(A) 申请公布日期 2005.11.10
申请号 JP20040189017 申请日期 2004.06.25
申请人 HITACHI VIA MECHANICS LTD 发明人 OSHIDA YOSHITADA;NAITO YOSHITATSU;SUZUKI MITSUHIRO;UCHIYAMA BUNJI;YAMAGUCHI TAKESHI
分类号 G02B26/10;G02B26/12;G03B27/54;G03F7/20;G03F7/22 主分类号 G02B26/10
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