发明名称 DEFECT INSPECTING/CLASSIFYING APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To provide a defect inspecting/classifying apparatus for imaging an inspected object, outputting an image containing a defect, extracting a defect region, comparing it with a database grouped with similar feature information, outputting defect classification information, easily discriminating between a flaw and dust attached on a substrate, or surely predicting the quantity of radiation from a laser for repair. <P>SOLUTION: In the defect inspecting/classifying apparatus, the inspected object 12 is imaged by an objective lens 14 and an image sensor 15, the detected image 16 containing the defect is outputted, the defect region is extracted, the feature information is numerically converted and compared with the database grouped with the similar feature information, and a defect classification code 25 is outputted. The defect inspecting/classifying apparatus is provided with confocal optical systems 18, 19b, 20, 21 for measuring and acquiring height information or three-dimensional information of the defect object. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005315792(A) 申请公布日期 2005.11.10
申请号 JP20040135979 申请日期 2004.04.30
申请人 SONY CORP 发明人 TAKAYAMA MASATO;OKAWACHI HIROKI
分类号 G01B11/02;G01M11/00;G01N21/956;G06T1/00;H01L21/66 主分类号 G01B11/02
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