发明名称 OPTICAL PULSE EVALUATION DEVICE AND IN-SERVICE OPTICAL PULSE EVALUATION DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide an optical pulse evaluation device and an in-service optical pulse evaluation device capable of evaluating a characteristic of an optical pulse itself or a sample incident therewith, in a relatively high bit-rate region. <P>SOLUTION: An optical pulse 42 output repeatedly from an optical pulse light source 43 at a frequency f<SB>rep</SB>is transmitted through the sample 93 on a sample stage 91 to be scanned by a wavelength-variable optical band pass filter 47. A detection result by a photodiode 51 is input into a phase detection circuit 45 together with the frequency f<SB>rep</SB>serving as a reference, and a result thereof is computed by an operation unit 58C of a personal computer 52 to find a spectral phase and a spectral intensity of the optical pulse transmitted through the sample 93. Those are corrected by a computed result in the condition where the sample 93 is removed to evaluate the characteristics such as deterioration or the like of the optical pulse 42 by the sample 93. A waveform of the optical pulse 42 as a light source, or the like, is also able to be evaluated. The optical pulse in in-service is also able to be evaluated in the present invention. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005315858(A) 申请公布日期 2005.11.10
申请号 JP20050059559 申请日期 2005.03.03
申请人 SUN TEC KK 发明人 UEHARA NOBORU;TAKUSHIMA YUICHI;KOSEKI YASUYUKI;HIROTA YOICHI
分类号 G01J3/26;G01B9/02;G01J9/00;G01J11/00;G01M11/00;H04B10/07;H04B10/079;H04B10/508;H04B10/524;H04B10/556;H04B10/58 主分类号 G01J3/26
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