Device for optical analysis of samples, e.g. food samples, has a probe with a side window for emitted and reflected light which is passed to a spectrometer or photometer via optical elements inside the probe

摘要

#CMT# #/CMT# A device for the optical analysis of samples, comprises a probe with a side window parallel to or at not more than 45[deg] to the long axis of the probe, for electromagnetic radiation emitted by a source and for reflected radiation which is passed to a spectrometer or photometer via optical elements inside the probe. #CMT# : #/CMT# A device for the optical analysis of samples in the form of pure substances or mixtures, with a probe which can be introduced into the sample and a transparent window for electromagnetic radiation from a radiation source in the probe and for radiation reflected from the sample into the probe, the emitted and reflected radiation being passed through the inside of the probe to a spectrometer or photometer. In this system, the window (2) is parallel to or at an angle of not more than 45[deg] to the long axis of the of the probe (1), the radiation passes out through the window (2) at an angle of 45-90[deg] to the long axis with the aid of optical elements, and the radiation reflected by the sample enters one or more optical elements (3, 3, 4, 6, 8) directly or by reflection and is then passed through the probe along its long axis towards the spectrometer. #CMT#USE : #/CMT# For the analysis of samples in the form of powder, paste or liquid, or of materials such as food, e.g. baked products or meat products. #CMT#ADVANTAGE : #/CMT# Enables the optical analysis of analytes in samples with minimal effect on the substance of the sample. #CMT#DESCRIPTION OF DRAWINGS : #/CMT# Diagram of apparatus for optical analysis of samples. 1 : probe 2 : transparent window element 3, 3 : optical fibres 7 : fixing elements. #CMT#INSTRUMENTATION AND TESTING : #/CMT# Preferred Apparatus: Radiation is passed through the probe by means of optical fibres (3, 3), a prism (4) or a deflector unit (8) which deflects the radiation by at least 45-90[deg] in relation to the long axis of the probe. The prism or deflector unit is mounted on the window or forms an integral component of the window, which is itself fitted flush in the outer wall of the probe. The probe is in the form of a hollow cylinder with a conical point at the front end and a reduced cross-section in the region of the window element (2), the surface of which is matched to the external surface contour of the probe. the arrangement of optical elements (3, 3, 4, 6, 8) within the probe is rotationally symmetrical. Preferred radiation is UV, visible, near-IR or IR radiation. An electronic analysis unit is connected to the spectrometer, for the comparison of actual and required values for analyte(s) in the sample. One or more of the optical elements (3, 3, 4, 6, 8) may be provided with anti-reflection coatings and/or optical interference coatings, and/or may consist of material which shows selective absorption for at least one wavelength. The optical deflector unit collimates or focusses the radiation.