发明名称 Film acoustic wave device, manufacturing method and circuit device
摘要 A film acoustic wave device having similar properties are obtained by changing at least one of the length and/or the width of upper electrodes; the distance between the upper electrodes; the length and/or the width of connecting patterns; the areas of bonding pads; and the pattern shape for the film acoustic wave device such as the area of capacitor electrodes electrically connected to the bonding pads. Property variations of the film acoustic wave devices caused from the positioning at a wafer is compensated for.
申请公布号 US6963155(B1) 申请公布日期 2005.11.08
申请号 US19980202070 申请日期 1998.12.08
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 WADAKA SHUSOU;MISU KOICHIRO;NAGATSUKA TSUTOMU;KIMURA TOMONORI;KAMEYAMA SHUMPEI
分类号 H01L27/20;H03H3/04;H03H9/05;H03H9/13;H03H9/17;H03H9/56;(IPC1-7):H01L41/08 主分类号 H01L27/20
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