发明名称 Probe device, probe card channel information creation program, and probe card information creation device
摘要 A probe device includes a supporting member for supporting the probe card having a plurality of channels. Each of the channels has a group of probes which are brought into contact with plural electrode pads of one of objects to be inspected. The probe device further includes a channel information creation unit for creating channel information containing a layout of a group of the plurality of channels and an identification number of each of the channels and transmitting the created channel information to a controller, a channel information memory unit for storing the channel information received from the channel information creation unit, and an object layout memory unit for storing layout information of the objects. The controller performs an inspection of the objects based on the channel information stored in the channel information memory unit and the layout information of the objects stored in the object layout memory unit.
申请公布号 US6963208(B2) 申请公布日期 2005.11.08
申请号 US20050038026 申请日期 2005.01.21
申请人 TOKYO ELECTRON LIMITED 发明人 FUKASAWA YUKIHIKO;ABE HIRONOBU
分类号 G01R1/06;G01R1/073;G01R31/28;G01R31/319;G01R35/00;H01L21/66;(IPC1-7):G01R31/02 主分类号 G01R1/06
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