发明名称 Spin-injection devices on silicon material for conventional BiCMOS technology
摘要 Spin-based microelectronic devices can be realized by utilizing ferromagnetic structures that make good ohmic contact with silicon, in order to avoid the Schottky barrier problem plaguing existing approaches to spin-based microelectronics, while allowing the devices to be based on silicon substrates, which are well-known and used in the industry. Thin layers of metal silicide, such as CoSi<SUB>2 </SUB>and NiSi<SUB>2</SUB>, are used as an intermediate layer between ferromagnetic contacts, such as cobalt and nickel contacts, and the silicon substrate. The thin silicide layers provide good ohmic contact between the ferromagnetic contacts and silicon, such that spin-polarized carriers can be injected into the silicon, and detected out of the silicon, without loss of spin polarization.
申请公布号 US6963091(B1) 申请公布日期 2005.11.08
申请号 US20030743845 申请日期 2003.12.22
申请人 NATIONAL SEMICONDUCTOR CORPORATION 发明人 VASHCHENKO VLADISLAV;MIAN MICHAEL;HOPPER PETER J.
分类号 H01L27/06;H01L29/45;H01L29/66;(IPC1-7):H01L29/66 主分类号 H01L27/06
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