发明名称 Apparatus and method for calibrating equipment for high frequency measurements
摘要 Calibration standards for accurate high frequency or wide bandwidth calibration measurements. A "short" or "reflect" standard is formed in a printed circuit board from a conductive coating on a generally planar surface. The conductive coating connects a signal trace to one or more ground planes. The generally planar surface is at least as wide as the signal trace and is preferably several times wider than the signal trace to provide a short standard with properties uniform over a wide frequency range. The short standard is incorporated into a printed circuit upon which a device under test is to be mounted. Connections to the short standard are made through components equivalent to components used to connect a device under test. When a through and line standard are added to the same board, the test board contains all the standards needed for a TRL calibration.
申请公布号 US6963209(B1) 申请公布日期 2005.11.08
申请号 US20040897638 申请日期 2004.07.23
申请人 TERADYNE, INC. 发明人 GAILUS MARK W.;CARTIER, JR. MARC B.
分类号 G01R31/02;G01R35/00;H05K1/00;H05K1/02;H05K3/40;H05K3/42;(IPC1-7):G01R31/02 主分类号 G01R31/02
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