发明名称 |
METHOD OF MANUFACTURING GaN CRYSTAL AND GaN CRYSTAL SUBSTRATE, GaN CRYSTAL AND GaN CRYSTAL SUBSTRATE OBTAINED BY THE METHOD, AND SEMICONDUCTOR DEVICE INCLUDING THE SAME |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method of manufacturing a GaN crystal and a GaN crystal substrate, by which the high quality GaN crystal and GaN crystal substrate can be manufactured under mild conditions of low pressure and low temperature. <P>SOLUTION: In the method of manufacturing the GaN crystal, comprising forming the GaN crystal by reacting gallium and nitrogen in a mixed melt of gallium and sodium under a gas atmosphere containing nitrogen, the reaction of the gallium and the nitrogen is performed under a pressurizing condition that exceeds atmospheric pressure, and the pressure P1 (atm (×1.013×10<SP>5</SP>Pa)) of the pressurizing condition is set so as to satisfy the condition expressed by following conditional expression (I): P≤P1<(P+45) (I), wherein, P (atm (×1.013×10<SP>5</SP>Pa)) denotes the minimum pressure required for generating the GaN crystal at a temperature T°C of the mixed melt. <P>COPYRIGHT: (C)2006,JPO&NCIPI |
申请公布号 |
JP2005306709(A) |
申请公布日期 |
2005.11.04 |
申请号 |
JP20040248866 |
申请日期 |
2004.08.27 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD;MORI YUSUKE |
发明人 |
KITAOKA YASUO;MINEMOTO TAKASHI;KIDOGUCHI ISAO;SASAKI TAKATOMO;MORI YUSUKE;KAWAMURA SHIRO;MORISHITA MASANORI |
分类号 |
C30B29/38;C30B9/10;H01L21/208;H01L33/32;H01S5/323 |
主分类号 |
C30B29/38 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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