| 摘要 |
PROBLEM TO BE SOLVED: To provide a scanning type laser microscope device that can easily and accurately control the light intensity of laser light having a plurality of wavelengths or whose abnormal place can easily be specified. SOLUTION: The scanning type laser microscope device through which light emitted from an irradiated sample 15 is observed by putting together a plurality of laser light beams A and B emitted by a plurality of LDs 3 and 4 and scanning the sample 15 with the composite laser light AB through an optical system guiding the laser light AB to the sample 16 is equipped with a photoelectric detector 16 which monitors the light intensity of the composite laser light AB and a control part 17 which performs time-division control over the projection of the laser light beams A and B and feeds the light intensity monitored by the photoelectric detector 16 back to control the light intensities of the respective laser light beams A and B. COPYRIGHT: (C)2006,JPO&NCIPI
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