发明名称 SUBSTRATE-HOLDING MEMBER, ALIGNER, AND DEVICE MANUFACTURING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a substrate-holding member and an aligner which can maintain exposure accuracy and measurement accuracy by suppressing the temperature change of a fluid, and the generation of temperature distribution, when applying immersion method. <P>SOLUTION: A substrate holder PH is used in the aligner for exposing a substrate P, by irradiating the exposure light on the substrate P via a projection optical system PL and fluid LQ. The substrate holder PH is coated by a functional layer 35 composed of a material which can be processed, in such a way that a contact surface 34A in contact with substrate P possesses profile irregularity higher than that of the substrate PB of the substrate holder PH. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005310933(A) 申请公布日期 2005.11.04
申请号 JP20040123712 申请日期 2004.04.20
申请人 NIKON CORP 发明人 NAKANO KATSUSHI;YAMATO SOICHI;UMAGOME NOBUTAKA
分类号 G03F7/20;H01L21/027;H01L21/68;H01L21/683 主分类号 G03F7/20
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