发明名称 DEPOSITION METHOD FOR NON-VOLATILE RESISTANCE SWITCHING MEMORY
摘要 PROBLEM TO BE SOLVED: To provide a deposition method for a non-volatile resistance switching memory. SOLUTION: The method for depositing a switching material can be switched between persistent conductive states. The microelectronic device is a non-volatile resistance switching memory comprising the switching material for storing digital information. The method comprises a step of depositing the switching material by a standard CMOS deposition technique at a temperature lower than 400°C. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005311356(A) 申请公布日期 2005.11.04
申请号 JP20050108749 申请日期 2005.04.05
申请人 INTERNATL BUSINESS MACH CORP <IBM> 发明人 ALLENSPACH ROLF;BEDNORZ JOHANNES G;MEIJER GERHARD INGMAR;LAM CHUNG HON;STUTZ RICHARD;WIDMER DANIEL
分类号 H01L21/20;H01L21/8238;H01L27/10;H01L45/00;(IPC1-7):H01L27/10 主分类号 H01L21/20
代理机构 代理人
主权项
地址