发明名称 |
DEPOSITION METHOD FOR NON-VOLATILE RESISTANCE SWITCHING MEMORY |
摘要 |
PROBLEM TO BE SOLVED: To provide a deposition method for a non-volatile resistance switching memory. SOLUTION: The method for depositing a switching material can be switched between persistent conductive states. The microelectronic device is a non-volatile resistance switching memory comprising the switching material for storing digital information. The method comprises a step of depositing the switching material by a standard CMOS deposition technique at a temperature lower than 400°C. COPYRIGHT: (C)2006,JPO&NCIPI |
申请公布号 |
JP2005311356(A) |
申请公布日期 |
2005.11.04 |
申请号 |
JP20050108749 |
申请日期 |
2005.04.05 |
申请人 |
INTERNATL BUSINESS MACH CORP <IBM> |
发明人 |
ALLENSPACH ROLF;BEDNORZ JOHANNES G;MEIJER GERHARD INGMAR;LAM CHUNG HON;STUTZ RICHARD;WIDMER DANIEL |
分类号 |
H01L21/20;H01L21/8238;H01L27/10;H01L45/00;(IPC1-7):H01L27/10 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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