发明名称 |
TRANSPORT POD PROTECTED BY THERMOPHORESIS EFFECT |
摘要 |
PROBLEM TO BE SOLVED: To improve the removal of contaminated particles by avoiding the adhesion of the contaminated particles onto the effective surface of a mask or semiconductor wafer while the mask or semiconductor wafer is placed in a transport pod. SOLUTION: The transport pod 1 for the mask or semiconductor wafer 2 is provided with a leakage preventive peripheral wall 3 enclosing an internal space 4 that receives the mask or wafer 2. A thermally conductive support means 11 retains the mask or wafer 2. A cold plate 7 thermally connected to a cooling source 8 generates a temperature gradient toward the main surface 6 of the mask or wafer 2 that should be protected from the contamination caused by the particles. The plate 7 is retained by a connection means 7b including a heat insulation means 7c. An on-board energy source 9 supplies an electric power to the source 8, thereby largely reducing the deposition of the contaminated particles onto the surface 6 of the mask or wafer 2. COPYRIGHT: (C)2006,JPO&NCIPI |
申请公布号 |
JP2005311360(A) |
申请公布日期 |
2005.11.04 |
申请号 |
JP20050117817 |
申请日期 |
2005.04.15 |
申请人 |
ALCATEL |
发明人 |
RIVAL JEAN-LUC;KAMBARA HISANORI;ROLLAND BERNARD |
分类号 |
H01L21/673;(IPC1-7):H01L21/68 |
主分类号 |
H01L21/673 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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