发明名称 FERROELECTRIC MEMORY DEVICE AND MANUFACTURING METHOD THEREFOR
摘要 PROBLEM TO BE SOLVED: To provide a ferroelectric memory device and a manufacturing method for the ferroelectric memory device for suppressing a damage arising at an interface of an upper electrode and a ferroelectric substance when manufacturing a capacitor. SOLUTION: The ferroelectric memory device includes a substrate 100, a ferroelectric capacitor 130 formed above the substrate 100 and having a lower electrode 120, a ferroelectric film 105 and an upper electrode 106; hydrogen barrier films 107 and 108 arranged to cover the ferroelectric capacitor 130; and an interlayer insulating film 109 provided above the hydrogen barrier films 107 and 108. The film thickness of the part provided above the upper electrode 106 of the hydrogen barrier films 107 and 108 is larger than that of the part arranged on the side wall of the ferroelectric capacitor 130 in the hydrogen barrier films 107 and 108. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005311297(A) 申请公布日期 2005.11.04
申请号 JP20050005341 申请日期 2005.01.12
申请人 SEIKO EPSON CORP 发明人 TAMURA HIROAKI;TAGAWA TERUO
分类号 H01L21/768;G11C11/22;H01L21/82;H01L21/8246;H01L27/10;H01L27/105;H01L27/108;H01L27/115;H01L29/76;(IPC1-7):H01L27/105 主分类号 H01L21/768
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