发明名称 THERMAL TYPE TRIPPING DEVICE AND CIRCUIT BREAKER USING THE SAME
摘要 <p>A thermal type tripping device adapted to trip a circuit in that a bimetal (2) is heated by overcurrent to cause the curving of the bimetal (2), wherein at least part of the surface of the bimetal (2) has a black color or matte black color (7). This makes it possible to measure the temperature of the bimetal (2) with high accuracy by using a non-contact type thermometer. Further, the temperature measuring section (8) of the bimetal is provided with a bend process section (11) whose surface has a matte black color.</p>
申请公布号 WO2005104159(A1) 申请公布日期 2005.11.03
申请号 WO2004JP05705 申请日期 2004.04.21
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA;KAWAMURA, KOUJI;AKITA, HIROYUKI;MURAI, MASATOSHI;YONEZAWA, HIROTOSHI;NAITO, SATORU 发明人 KAWAMURA, KOUJI;AKITA, HIROYUKI;MURAI, MASATOSHI;YONEZAWA, HIROTOSHI;NAITO, SATORU
分类号 H01H71/16;H01H73/02;(IPC1-7):H01H71/16 主分类号 H01H71/16
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