发明名称 APERTURE PLATE FOR LITHOGRAPHY SYSTEMS
摘要 An aperture plate for lithography systems capable of improving NILS. The aperture plate includes a light-intercepting region and a light-transmitting region. The light-intercepting region has a reference center point. A horizontal reference line and a vertical reference line are defined on the light-intercepting region and intersect the reference center point. The light-transmitting region includes four pole apertures defining a central area. Two of the pole apertures are positioned on the horizontal reference line, and the other pole apertures are positioned on the vertical reference line. The light-transmitting region further includes at least a symmetric pattern aperture positioned in the central area, wherein the symmetric pattern aperture has a symmetric center overlapping the reference center point.
申请公布号 US2005243440(A1) 申请公布日期 2005.11.03
申请号 US20040709311 申请日期 2004.04.28
申请人 WU YUAN-HSUN 发明人 WU YUAN-HSUN
分类号 G02B9/00;G02B9/08;G03F7/20;(IPC1-7):G02B9/00 主分类号 G02B9/00
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