发明名称 Semiconductor memory device invalidating improper control command
摘要 A control circuit in a semiconductor memory device accessing a memory cell for a plurality of cycles includes an internal command generating circuit and a mask signal generating circuit. Upon receiving a control command, the internal command generating circuit outputs an internal signal instructing an operation to access the memory cell at H level when a mask signal is at L level, while outputs an internal signal at L level when the mask signal is at H level, because a latch circuit is reset. The mask signal generating circuit outputs the mask signal at H level for a following cycle, when the internal signal is output at H level.
申请公布号 US2005243643(A1) 申请公布日期 2005.11.03
申请号 US20050174472 申请日期 2005.07.06
申请人 RENESAS TECHNOLOGY CORP. 发明人 SETOGAWA JUN
分类号 G11C11/401;G11C7/10;G11C7/22;G11C11/407;G11C11/4076;(IPC1-7):G11C8/00 主分类号 G11C11/401
代理机构 代理人
主权项
地址