发明名称 Process of manufacturing a semiconductor device
摘要 A process of manufacturing a semiconductor device includes the steps of forming a stacked structure of a first III-V compound semiconductor layer containing In and having a composition different from InP and a second III-V compound semiconductor layer containing In. The second III-V compound semiconductor layer is formed over the first III-V compound semiconductor layer and growing an InP layer at regions adjacent the stacked structure to form a stepped structure of InP. The process further includes the step of wet-etching the stepped structure and the second III-V compound semiconductor layer using an etchant containing hydrochloric acid and acetic acid to remove at least the second III-V compound semiconductor layer.
申请公布号 US2005245089(A1) 申请公布日期 2005.11.03
申请号 US20050155474 申请日期 2005.06.20
申请人 FUJITSU QUANTUM DEVICES LIMITED 发明人 WATANABE TAKAYUKI;MICHITSUTA TSUTOMU;HASEGAWA TARO;FUJII TAKUYA
分类号 H01S5/042;H01L21/306;H01S5/20;H01S5/227;(IPC1-7):H01L21/302 主分类号 H01S5/042
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