| 摘要 |
This process includes the stages to apply onto the surface a structure to be inspected, a grid, to direct a light source onto this grid so as to create a shadow on the structure, then to record an image of the pattern observed, to create a graphic representation of the image recorded and to characterize the damage from this representation. The device enabling the implementation of the process consists of a support ( 2 ) comprising a grid or screen ( 1 ), a light source ( 3 ) and an image acquisition device ( 8 ). Once the images are recorded, the invention calls upon processing devices that permit determining the position in space, in particular, height, of each point of the image and as such of the surface observed.
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