发明名称 MANUFACTURING METHOD FOR THIN FILM TRANSISTOR ARRAY PANEL
摘要 <p>A method of manufacturing a thin film transistor array panel is provided, which includes forming a semiconductor layer of poly silicon, forming a gate insulating layer on the semiconductor layer, forming a conductive layer including a first metal layer and a second metal layer formed on the first metal layer, depositing and forming a photoresist pattern on the first and the second metal layer, forming a gate electrode by etching the conductive layer, wherein the gate electrode includes a double layered structure including the first metal layers having a narrower width than a width of the second metal layer, forming a source region and a drain region in the semiconductor layer by doping conductive impurities, ashing the photoresist pattern to expose a portion of the second metal, etching the exposed portion of the second metal layer, removing the photoresist pattern, and forming lightly doped drain regions having a lower concentration compared to the source region and the drain region by using the gate electrode as a doping mask.</p>
申请公布号 KR20050104953(A) 申请公布日期 2005.11.03
申请号 KR20040030425 申请日期 2004.04.30
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHO, SUNG HWAN
分类号 H01L21/00;H01L21/336;H01L21/77;H01L21/84;H01L29/423;H01L29/76;H01L29/786;H01L29/94;H01L31/062;H01L31/113;H01L31/119;(IPC1-7):H01L29/786 主分类号 H01L21/00
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