发明名称 Quality control apparatus and control method of the same, and recording medium recorded with quality control program
摘要 <p>Various items of data collected at different process steps are associated on production sites where traceability is hard to conduct. A quality control apparatus controls a manufacturing process in order to manufacture products of predetermined quality, including a data storing part which collects measurement data measured by multiple devices disposed in a manufacturing process and stores the collected measurement data along with measured time or collected time; and a scheduler which associates the measurement data of the devices with each other in consideration of dead time generatedbetween the devices at measured time or collected time.</p>
申请公布号 EP1591966(A2) 申请公布日期 2005.11.02
申请号 EP20050252652 申请日期 2005.04.28
申请人 OMRON CORPORATION 发明人 SUGIHARA SHIRO;FUGII TORU;SONO MINEO
分类号 G06Q10/06;G05B19/418;G06Q50/00;G06Q50/04;G07C3/00;G07C3/14;(IPC1-7):G07C3/00 主分类号 G06Q10/06
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