发明名称 Semiconductor device having multi-layer interconnection structure and method of manufacturing the same
摘要 A semiconductor device includes a foundation having a first conductive region, and an inter-connection layer provided separate from the foundation. A first region occupying a range from the foundation to the interconnection layer is filled with gas or provided with a first interlayer dielectric film. A first connection plug provided in the first region electrically connects the first conductive region and the interconnection layer. A dielectric first support plug is provided in the first region so that so that the gas can be filled or the first interlayer dielectric film can be provided between the first connection plug and the first support plug. Further, the first plug extends from the interconnection layer to the foundation, and has a second Young's modulus.
申请公布号 US6960834(B2) 申请公布日期 2005.11.01
申请号 US20030628372 申请日期 2003.07.29
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 NAKAMURA NAOFUMI;MATSUNAGA NORIAKI
分类号 H01L21/768;H01L23/522;H01L23/532;(IPC1-7):H01L23/48;H01L29/40 主分类号 H01L21/768
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