| 摘要 |
A conductor condition inspecting device capable of accurately detecting the condition of an object of inspection in non-contact when the object of inspection is a conductor. Two sensor sheets (570, 580) are disposed almost in parallel at a conductor to be inspected (520) to which an inspection signal is fed from a feed unit or a portion in the vicinity of the conductor to be inspected (520), the shape of a conductive tab portion facing the sensor sheet (570) is inspected by a measurement level from the sensor sheet (570), detection signals from the sensor sheets (570, 580) are subtracted from each other by a subtracter (550), a detection value from one sensor sheet is divided by the subtracted result by a divider (560) to normalize the detection value from one sensor sheet, and a relative detection signal value ratio from the both sensor sheets is detected to obtain a detection result corresponding to the distance between a sensor sheet and the conductor (520) as X.
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