发明名称 Method of forming a metal gate
摘要 In a method of forming a metal gate electrode, an annealing process is performed in a hydrogen-containing gas ambient following a selective oxidation process. During the annealing process, a metal oxide layer formed by the selective oxidation process is removed by a reduction reaction or hydrogen atoms are contained in the metal oxide layer to suppress whisker nucleation and surface mobility.
申请公布号 US6960515(B2) 申请公布日期 2005.11.01
申请号 US20010011843 申请日期 2001.12.04
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHO MAHN-HO;KU JA-HUM;CHOI CHUL-JOON;CHO JUN-KYU;HEO SEONG-JUN
分类号 H01L21/28;H01L29/423;H01L29/43;H01L29/49;H01L29/78;(IPC1-7):H01L21/320;H01L21/31;H01L21/823 主分类号 H01L21/28
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