发明名称 Positioning and inspecting system and method using same
摘要 A system for inspecting signals of the circuits on a panel includes a moveable stage with a transparent work area for holding the panel to be tested; a probe for contacting the panel; a tester for receiving a signal via the probe; an image sensing device disposed in an opposite side to the probe with respect to the stage; and image display device coupled to the image sensing device. The image display device includes a screen having a cross mark. When the system is operating, the probe is aligned with the image sensing device such that the captured image of the probe is displayed on the center of the cross.
申请公布号 US6961081(B2) 申请公布日期 2005.11.01
申请号 US20020170455 申请日期 2002.06.14
申请人 HANNSTAR DISPLAY CORP. 发明人 CHEN CHENG MING
分类号 G02F1/13;G09G3/00;(IPC1-7):H04N7/12;H04N7/12;H04N7/18;H04N9/47 主分类号 G02F1/13
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