Memory chip and apparatus for testing a memory chip

摘要

The present invention provides a memory chip ( 100 ) which can be operated in a normal mode and in a test mode (TM) and which has a device ( 102 ) for outputting data from the memory chip ( 100 ) and a device ( 104 ) for enabling the device ( 102 ) for outputting data when the test mode (TM) has been activated. The device ( 104 ) for enabling the device ( 102 ) for outputting data has a device for masking data so that only particular portions of the data are output when a data masking state (DQM) has been activated.