发明名称 |
TEMPERATURE CONDITIONED LOAD LOCK, LITHOGRAPHIC APPARATUS COMPRISING SUCH A LOAD LOCK AND METHOD OF MANUFACTURING A SUBSTRATE WITH SUCH A LOAD LOCK |
摘要 |
<p>A load lock for a lithographic apparatus is arranged to transfer an object, like a substrate, into and from the lithographic apparatus. The load lock outer wall defining at least part of a load lock volume accommodating a support unit for supporting the object when in the load lock. The load lock also has a temperature conditioned structure to control the temperature of the object to a desired temperature at least before the object is transferred from the load lock towards the lithographic projection apparatus.</p> |
申请公布号 |
SG115630(A1) |
申请公布日期 |
2005.10.28 |
申请号 |
SG20040001152 |
申请日期 |
2004.03.09 |
申请人 |
ASML NETHERLANDS B.V. |
发明人 |
KLOMP, ALBERT JAN HENDRIK;HOOGKAMP, JAN FREDERIK;VISSER, RAIMOND;VUGTS, JOSEPHUS CORNELIUS JOHANNES ANTONIUS;VULLINGS, HENRICUS JOHANNES LOUIS MARIE;KUIPERS, LEO WILHELMUS MARIA;FRANSSEN, JOHANNES HENDRIKUS GERTRUDIS |
分类号 |
H01L21/027;G03F7/20;H01L21/68;(IPC1-7):G03F7/20 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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