发明名称 LSI INSPECTION CIRCUIT AND LSI INSPECTION METHOD
摘要 PROBLEM TO BE SOLVED: To inspect an input-output interface easily and quickly by avoiding the limitation of asynchronous or high speed inspection at the time of inspection of the high speed LSI. SOLUTION: A specific simple data inputted from an LSI inspection device 101 is converted by an encoder 104 into a complicated data, which is transmitted from a transmission LSI 102 to a receiving LSI 107. In the received LSI, the received data is decoded by a decoder circuit 109. The decoded data are a simple data, so the expected value is easily determined by the LSI inspection device 101. At the time of inspecting a high speed LSI, the input-output interface is inspected easily, in a short period of time by avoiding the limitation by asynchronous or high speed. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005300432(A) 申请公布日期 2005.10.27
申请号 JP20040119682 申请日期 2004.04.15
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 ITO WATARU
分类号 G01R31/28;(IPC1-7):G01R31/28 主分类号 G01R31/28
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