发明名称 ADAPTIVE THERMAL CONTROL OF LITHOGRAPHIC CHEMICAL PROCESSES
摘要 A system, apparatus, and method for thermally controlling lithographic chemical processes is disclosed herein. The thermal control system includes a multi-zone thermal sensing unit containing a plurality of thermal sensor elements. These thermal elements are configured to detect the temperature of a plurality of pre-defined zones on the substrates. The system also includes a multi-zone thermal adjustment unit that contains a plurality of thermal coupler elements, which are configured to adjust the temperature of the pre-defined zones. The system further includes a thermal controller unit, operatively and communicatively coupled to the multi-zone thermal sensing unit and the multi-zone thermal adjustment unit. The thermal controller unit receives the detected temperature from the multi-zone thermal sensing unit, processes the detected temperature information, generates temperature control information based on the processed temperature information, and communicates the temperature control information to the multi-zone thermal adjustment unit to adjust the temperatures of the pre-defined zones.
申请公布号 WO2005033801(A3) 申请公布日期 2005.10.27
申请号 WO2004US28550 申请日期 2004.08.31
申请人 ASML HOLDING N.V.;OWEN, CASSANDRA, M.;TEL, WIM, T.;SINKWITZ, STEPHAN, EWALD 发明人 OWEN, CASSANDRA, M.;TEL, WIM, T.;SINKWITZ, STEPHAN, EWALD
分类号 G03F7/00;G03F7/20;G03F7/30;G03F7/38;H01L21/00 主分类号 G03F7/00
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