| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit device with which high reliability of a fuse circuit is attained. SOLUTION: In the semiconductor integrated circuit device, a plurality of fuse circuits with scan functions consisting of fuse circuits comprising a first latch circuit which fetches a signal from the previous stage corresponding to a first clock or fetches a fuse signal of itself corresponding to a first timing signal, a second latch circuit which fetches a held signal corresponding to a second clock and transmits it to the next stage, an input circuit which fetches the held signal of the first latch circuit corresponding to the second timing signal and writes it in a fuse means and an output circuit for outputting a fuse signal corresponding to stored information of the fuse means, are connected like a chain, and the device writes a fuse disconnection signal in each fuse circuit with scan function by serially scanning in each fuse circuit with scan functions corresponding to the first and second clocks and performs write verification by scanning out the fuse signal. COPYRIGHT: (C)2006,JPO&NCIPI
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