发明名称 SUBSTRATE PROCESSING APPARATUS AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a substrate processing apparatus for a semiconductor device having a reducible leakage current, and also to provide a method for manufacturing the semiconductor device. SOLUTION: The substrate processing apparatus has a processing chamber for accommodating a substrate therein and a means for heating the substrate. At least, two gases are alternately supplied into the processing chamber to form a desired film on the surface of the substrate. At least, one of the two gases is supplied into the processing chamber even after a reaction between one gas and the surface of the substrate reaches its saturation. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005303153(A) 申请公布日期 2005.10.27
申请号 JP20040119691 申请日期 2004.04.15
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 SATO TAKETOSHI;SAKAI MASANORI;YAMAZAKI HIROHISA
分类号 H01L21/316;(IPC1-7):H01L21/316 主分类号 H01L21/316
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