发明名称 |
SUBSTRATE PROCESSING APPARATUS AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a substrate processing apparatus for a semiconductor device having a reducible leakage current, and also to provide a method for manufacturing the semiconductor device. SOLUTION: The substrate processing apparatus has a processing chamber for accommodating a substrate therein and a means for heating the substrate. At least, two gases are alternately supplied into the processing chamber to form a desired film on the surface of the substrate. At least, one of the two gases is supplied into the processing chamber even after a reaction between one gas and the surface of the substrate reaches its saturation. COPYRIGHT: (C)2006,JPO&NCIPI
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申请公布号 |
JP2005303153(A) |
申请公布日期 |
2005.10.27 |
申请号 |
JP20040119691 |
申请日期 |
2004.04.15 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC |
发明人 |
SATO TAKETOSHI;SAKAI MASANORI;YAMAZAKI HIROHISA |
分类号 |
H01L21/316;(IPC1-7):H01L21/316 |
主分类号 |
H01L21/316 |
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