发明名称 MARKING METHOD TO SEMICONDUCTOR SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To provide a marking method to semiconductor substrate for applying a marking that has excellent durability and discrimination property. SOLUTION: In the marking method to a semiconductor substrate, a pattern of a desired shape is formed by injecting colored ink from an ink jet nozzle to a semiconductor substrate 1. Therein, an ink-repellent film 22 is formed with a pattern of trimming a marking object part becoming the pattern of a desired shape using the colored ink disposed on the semiconductor substrate 1 by injecting ink-repellent liquid 21 from an ink jet nozzle 11 and, subsequently, a colored ink film 24 is formed by injecting colored ink 23 inside the ink-repellent film 22 from an ink jet nozzle 13. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005296857(A) 申请公布日期 2005.10.27
申请号 JP20040118473 申请日期 2004.04.14
申请人 HITACHI INDUSTRIES CO LTD 发明人 TAKAHASHI KENICHI
分类号 B41J2/01;B05D1/26;B05D1/32;H01L23/00;(IPC1-7):B05D1/32 主分类号 B41J2/01
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