发明名称 Vacancy-dominated, defect-free silicon
摘要 The present invention relates to single crystal silicon, in ingot or wafer form, having an axially symmetric vacancy dominated region and an axially symmetric silicon self-interstitial dominated region. Both the vacancy dominated and the silicon self-interstitial dominated regions are substantially free of agglomerated intrinsic point defects. The vacancy dominated region has a radial width of at least 15 mm and/or includes the central axis and the silicon self-interstitial dominated region is annular in shape and extends radially outward from the vacancy dominated region to the peripheral edge of the ingot or wafer. In ingot form, the axially symmetric regions have an axial length which is at least 20% of the length of the constant diameter portion of the ingot.
申请公布号 US2005238905(A1) 申请公布日期 2005.10.27
申请号 US20050102241 申请日期 2005.04.08
申请人 MEMC ELECTRONIC MATERIALS, INC. 发明人 FALSTER ROBERT J.;HOLZER JOSEPH C.;MARKGRAF STEVE A.;MUTTI PAOLO;MCQUAID SEAMUS A.;JOHNSON BAYARD K.
分类号 C30B15/00;C30B15/20;C30B15/22;C30B29/06;C30B33/00;H01L21/322;H01L29/12;(IPC1-7):H01L29/12 主分类号 C30B15/00
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