| 摘要 |
PROBLEM TO BE SOLVED: To provide a circuit board inspection device and a method capable of inspecting a circuit board at high speed by shortening the time required for inspection, concerning a device and a method for allowing a test current formed by superimposing a direct current on an alternating current to flow in order to inspect the circuit board having a plurality of circuits, and observing a secondary harmonic of the alternating current generated from a crack or a narrowed part caused by a temperature characteristic of heating and cooling of an inspection circuit by Joule heat, to thereby detect a potential defect. SOLUTION: This circuit board inspection device includes the first direct-current power source 21a, the second direct-current power source 21b and an alternating-current power source 22, first probe group 23a, 24a and second probe group 23b, 24b pairing respectively in order to be connected to both ends of the inspection circuit, and a switch 40 for switching and connecting the alternating-current power source to the first probe group or the second probe group. Preheating and inspection are switched between the plurality of inspection circuits by the switch, and preheating is performed in parallel before inspection, to thereby shorten the whole inspection time. COPYRIGHT: (C)2006,JPO&NCIPI
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