| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit which can prevent scan test constitution from causing the problems in the power consumption during a normal operation. SOLUTION: In the semiconductor integrated circuit having a plurality of scan storage elements having the function for outputting a state value during a scan test operation, it is characterized in that at least a part of the scan storage elements separately includes a first signal output part for transmitting an output signal during the normal operation and a second signal output part for transmitting an output signal during the scan test operation. Preferably, the first signal output part has the ability for driving a signal output line higher than that of the second signal output part, the second signal output part fixes the level of the output signal thereof during the normal operation, or the second signal output part outputs the state value which is delayed by a prescribed period of time of an operational clock with respect to the first signal output part, during the scan test operation. COPYRIGHT: (C)2006,JPO&NCIPI
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