发明名称 LIQUID TREATMENT DEVICE AND LIQUID TREATMENT METHOD
摘要 <p>Treatment liquid supply nozzles (10) are individually arranged on both left and right sides of a semiconductor wafer (W) in a treatment vessel (1). A discharge opening of each of the nozzles (10) faces the semiconductor wafer (W). According to a predetermined procedure, a treatment liquid is discharged from one or more selected nozzles (10). To perform chemical liquid treatment, for example, first a chemical liquid is discharged from nozzles (10) on the lowermost positions, and then nozzles (10) for discharging the chemical liquid are sequentially changed to upper ones. To perform rinse treatment while the chemical liquid in the treatment vessel (1) is replaced with a rinse liquid, for example, first the rinse liquid is discharged from the nozzles (10) on the lowermost positions, and then the rinse liquid is discharged from all the nozzles (10). By this, liquid treatment is improved in efficiency and uniformity.</p>
申请公布号 WO2005100637(A1) 申请公布日期 2005.10.27
申请号 WO2005JP06120 申请日期 2005.03.30
申请人 TOKYO ELECTRON LIMITED;TSURUSAKI, KOTARO;TANAKA, HIROSHI;TOSHIMA, TAKAYUKI;ESHIMA, KAZUYOSHI 发明人 TSURUSAKI, KOTARO;TANAKA, HIROSHI;TOSHIMA, TAKAYUKI;ESHIMA, KAZUYOSHI
分类号 C23F1/08;H01L21/00;H01L21/304;(IPC1-7):C23F1/08 主分类号 C23F1/08
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