发明名称 |
MANUFACTURING METHOD OF FLASH MEMORY |
摘要 |
PROBLEM TO BE SOLVED: To provide a manufacturing method of a flash memory which is reduced in the amount of an organic gaseous substance in an environmental atmosphere and capable of manufacturing a quantum dot having a size and/or density within an optimum range, in the manufacturing method the a flash memory which forms the quantum dot on the insulating film of a semiconductor substrate as a floating gate. SOLUTION: The manufacturing method of the flash memory retains the environmental atmosphere of the semiconductor substrate before forming the quantum dot clean by an organic gaseous substance removing means, in the manufacturing method of the flash memory which forms an insulating film on the semiconductor substrate and forms the quantum dot on the insulating film as the floating gate. COPYRIGHT: (C)2006,JPO&NCIPI |
申请公布号 |
JP2005302996(A) |
申请公布日期 |
2005.10.27 |
申请号 |
JP20040116705 |
申请日期 |
2004.04.12 |
申请人 |
NIPPON MUKI CO LTD;HIROSHIMA UNIV |
发明人 |
TSUTSUMI OSAMU;OKURA KENSAKU;IKEDA MITSUHISA;NIINUMA HITOSHI;YOKOYAMA ARATA |
分类号 |
H01L29/06;H01L21/8247;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L21/824 |
主分类号 |
H01L29/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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