| 摘要 |
A method for controlling the fabrication of microcavity OLED device includes providing a substrate (711, 712, 713), forming a microcavity OLED device including two mirror layers and one or more organic layers disposed between the two mirror layers (730), and illuminating the microcavity OLED device (760) and measuring the reflectivity spectrum to determine the wavelength of the reflectivity minimum (770). The method also includes comparing the wavelength of the reflectivity minimum to a target value to produce an difference signal, and making adjustments in accordance with the difference signal to the deposition rate or deposition time (750) of at least one of the organic layers in a subsequent OLED device (720) to reduce the difference signal in the subsequent microcavity OLED device. |
