发明名称 Patterning process and resist overcoat material
摘要 <p>In an immersion lithography process, a pattern is formed by forming a photoresist layer on a wafer, forming a protective coating on the photoresist layer from a resist overcoat material, exposing the layer structure to light in water, and developing. A water-insoluble, alkali-soluble material is used as the resist overcoat material.</p>
申请公布号 EP1589377(A2) 申请公布日期 2005.10.26
申请号 EP20050252395 申请日期 2005.04.18
申请人 SHIN-ETSU CHEMICAL CO., LTD. 发明人 HATAKEYAMA, JUN;HARADA, YUJI
分类号 G03F7/11;G03F7/20;(IPC1-7):G03F7/20 主分类号 G03F7/11
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