发明名称 TUNGSTEN SUPER FINE PARTICLE AND METHOD FOR PRODUCING THE SAME
摘要 <p>A particle of W oxide 2 such as a particle of WO3 is disposed on an amorphous carbon support film 1, onto the particle of W oxide 2 in an atmosphere of high vacuum an electron beam of an intensity of 10<23> to 10<24> e/cm<2>.sec being irradiated. Due to the irradiation of an electron beam 3 of such an intensity, ultra fine particles of W 4 of a particle diameter of for instance 10 nm or less are generated. The ultra fine particles of W consist of W effected to detach from the particle of W oxide. <IMAGE></p>
申请公布号 EP1146138(B1) 申请公布日期 2005.10.26
申请号 EP19990909259 申请日期 1999.03.19
申请人 JAPAN SCIENCE AND TECHNOLOGY CORPORATION;KABUSHIKI KAISHA TOSHIBA 发明人 TAMOU, YOSHITAKA;TANAKA, SHUN-ICHIRO;XU, BINGSHE
分类号 C22F3/00;B22F1/00;B22F9/02;B22F9/30;C23C14/22;C23C14/30;C23C24/00;(IPC1-7):C23C14/30;B22F9/20 主分类号 C22F3/00
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