发明名称 Process of making an integrated circuit comprising shallow trench isolation and corresponding integrated circuit
摘要 The procedure includes formation of hollow insulating grooves (2) inside a substrate (1) and the creation of active components (5) in and on the active zones between the grooves. The grooves are formed in an initial phase before the active components are made, and are filled with germanium or a silicon-germanium alloy. After the active components have been formed and encapsulated, an access is made through the encapsulating material through which the filling can be removed and the opening plugged.
申请公布号 EP1589572(A1) 申请公布日期 2005.10.26
申请号 EP20050290791 申请日期 2005.04.11
申请人 STMICROELECTRONICS S.A.;KONINKLIJKE PHILIPS ELECTRONICS N.V. 发明人 MARTIN, ALEXANDRE;VILLANUEVA, DAVY;SALVETTI, FREDERIC
分类号 H01L21/76;H01L21/764;H01L21/8234;H01L27/08;H01L27/088;(IPC1-7):H01L21/764 主分类号 H01L21/76
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