发明名称 Semiconductor device having low resistivity source and drain electrodes
摘要 A dummy gate crossing an active area having ends in contact with an isolation area is formed. A low area lower than a dummy gate is formed in the isolation area. Side walls are formed in the active area except the dummy gate. A semiconductor film having the same height as that of the dummy gate is formed in the low area. An oxide film is formed on the semiconductor film. The dummy gate is removed by the oxide film as a mask. The oxide film is removed by the semiconductor film as a stopper.
申请公布号 US6958500(B2) 申请公布日期 2005.10.25
申请号 US20030683280 申请日期 2003.10.14
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 SAITO TOMOHIRO
分类号 H01L21/28;H01L21/336;H01L29/423;H01L29/49;H01L29/51;H01L29/78;H01L29/786;(IPC1-7):H01L29/76;H01L29/94;H01L31/062;H01L31/113 主分类号 H01L21/28
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