Inspecting apparatus and inspecting method for circuit board

摘要

The present invention provides an apparatus and method for inspecting a circuit board at a high speed. A PDP driver module 100 as an object to be inspected has an onboard PDP driving LSI 110 . A plurality of circuit wirings 111 are connected to terminals of the LSI. An inspection apparatus 1 generates an LSI drive signal and sends it to input terminals 113 of the LSI 110 . A sensor 2 is positioned opposedly to the circuit wirings 111 in a non-contact manner. The sensor 2 detects voltage values in circuit wirings 111 caused by driving the LSI 110 , and the detected signals are analyzed by the inspection apparatus 1.