发明名称 NAND TYPE FLASH MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 <p>The present invention discloses a NAND type flash memory device and a method for manufacturing the same which can prevent patterns from being collapsed or thinly defined due to irregularity, by forming word lines or source and drain select lines in regular patterns, by electrically connecting floating gates and control gates of the select lines, by forming a dielectric layer and a polysilicon layer for protection on the whole surface of a semiconductor substrate on which a polysilicon layer for floating gates has been formed, partially removing the dielectric layer on the polysilicon layer which will be the source and drain select lines, and forming a polysilicon layer for control gates and a silicide layer.</p>
申请公布号 KR20050101688(A) 申请公布日期 2005.10.25
申请号 KR20040026769 申请日期 2004.04.19
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, BYOUNG KI
分类号 H01L21/8247;H01L21/28;H01L21/8236;H01L27/105;H01L27/115;H01L29/423;H01L29/788;H01L29/792;(IPC1-7):H01L27/115 主分类号 H01L21/8247
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