| 摘要 |
The invention relates to a method and device for measuring an object for measurement, comprising at least one reference structure for the definition of an object coordinate system, fixed with relation to the object, by means of a measuring system, which comprises at least one sensor system for recording a contour of the object for measuring in a measurement coordinate system. According to the invention, the object for measurement is placed in a measuring position in the recording region of the sensor system, the position of the object coordinate system is fixed by means of the reference structure, the object coordinate system is linked to the measurement coordinate system, the sensor system is turned about a rotation axis relative to the object for measurement, in order to determine contour data and a processing of the contour data carried out in an analytical unit, taking into account the position of the object coordinate system. The invention further relates to an application for contour determination. |
