ELECTROMAGNETIC FIELD ANALYSIS APPARATUS, ELECTROMAGNETIC FIELD ANALYSIS METHOD AND ELECTROMAGNETIC FIELD ANALYSIS PROGRAM

摘要

PROBLEM TO BE SOLVED: To provide an apparatus, a method, and program that precisely analyze an electromagnetic field including a microstructural small antenna and a large scatterer. SOLUTION: The apparatus includes: an FDTD area setting means 10 for setting an FDTD area enclosing a scatterer; a closed surface setting means 20 for setting in the FDTD area a closed surface S enclosing the scatterer and a closed surface S' enclosing the closed surface S and not enclosing a wave source; wave source electromagnetic current calculating means 30; source-wave-equivalent electromagnetic current calculating means 40 for calculating an equivalent electromagnetic current of the wave source as using the closed surface S as an equivalent wave source surface; a total electromagnetic field calculating means 50 for calculating a total electromagnetic field by the FDTD method; a scattered electromagnetic field calculating means 60 for calculating a scattered electromagnetic field by the scatterer by the FDTD method; a scattered-electromagnetic-field-equivalent electromagnetic current calculating means 70 for calculating an equivalent electromagnetic current of the scattered electromagnetic field as using the closed surface S' as an equivalent wave source surface of the scattered electromagnetic field; and a wave source boundary condition calculating means 80 for calculating an electromagnetic field reflected by the scatterer as boundary conditions of the wave source. COPYRIGHT: (C)2006,JPO&NCIPI