发明名称 RESIDUAL RICE BRAN MEASURING METHOD OF POLISHED RICE
摘要 PROBLEM TO BE SOLVED: To provide a residual rice bran measuring method capable of detecting accurately residual rice bran even in the case of polished rice having an unripe grain portion. SOLUTION: In this method, reflected light and fluorescence are received from polished rice irradiated with light having a specific wavelength, and the received reflected light data and fluorescence data are used. In this case, since data pertinent to the unripe grain portion in the reflected light data and fluorescence data are excluded by operation, even if the polished rice has the unripe grain portion, existence of the residual rice bran can be clearly discriminated without being influenced by the unripe grain portion. Consequently, a threshold can be set easily, and the residual rice bran can be detected accurately. Measurement accuracy of the residual rice bran on the polished rice is also improved. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005291869(A) 申请公布日期 2005.10.20
申请号 JP20040106233 申请日期 2004.03.31
申请人 SATAKE CORP 发明人 MAEHARA HIROYUKI;ODA HIDETO;MATSUDA MICHIKO
分类号 G01N21/64;G01N21/17;G01N33/10;(IPC1-7):G01N21/17 主分类号 G01N21/64
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